133 BC - 67 BC

Pergamum    Mysia
Πέργαμον   Μυσία

 AR 29
 SHH 6881

Material Composision Analysis
Definitions
Material Analysis Definitions


Surface material layers are removed gradually with a rotating polisching brush.
Layer thickness is assessed from weight, mean diameter and an approximate density,
as shown in the definitions above.
7391 Photo Initial obv & rev
SHH 6881 Initial; zobv = 1.827 mm; zrev = 0.000 mm 		7391 Photo obv Pol 1 obv
obv Pol 1: obv
6881

6881
6881
6881
 6881

 Measurement coordinates  r and φ are  referred to the die orientation of the obverse
Electrical Conductivity σ, SigmaTest, 8 mm sensor, 12.11./??.??.2021

Comment
 κΗz
60
 120
 240
 480
 960





z
 σ
 z
 σ
 z
 σ
 z
 σ
 z
 σ
r
 φ



mm
 MS/m
 mm
 MS/m mm
 MS/m mm
 MS/m mm
 MS/m
mm
 °
















 Initial obv
1.264
 13.8
 1.381
 11.1
 1.478
   9.2
 1.564
   8.3
 1.635
   8.0
7
 0
 Initial
 rev
0.557
 13.6
 0.428
 11.5
 0.321
 10.2
 0.234
   9.6
 0.167
   9.5
7
 0

Composition Niton XL2 air plus, 8 mm Colimator, ?`?.??.2021
Comments

Cu
 Sn
 Pb
 Zn
 As
 Au
 Ag
 Fe
 Ni
 Cr
 Al
 Si
 P
z
 r
 φ



%
 %
 %
 %
 %
 %
 %
 %
 %
 %
 %
 %
 %
mm
 mm
 °




















 Initial
 obv














1.827
 7
 0
 Initial
 rev














0
 7
 0
0.3
   
Graphic  presentaion of measurement results
XRF-Data for Al, Si and P have been included, because they have an effect on electrical conductivity.
XRF Ag(z) +/- Al, Si, P
Fig.1   XRF Ag (z)
with and without light metals
 XRF Cu & Pb
Fig. 2   XRF Cu(z) & Pb (z)

 XRF Al & Si
Fig. 3   XRF Al(z) & Si (z)
XRF Cu+Pb = f(Al+Si)
Fig. 4   XRF Cu+Pb = f(Al+Si)

 σ(z, Removed Surface Layers)
Fig. 5   σ (z, f)
Varying surface layer removal
 XRF & σ Cu & Cu+Pb = f(σ 960 kHz)
Fig. 6   XRF Cu & Cu+Pb =
= f(σ, 960 kHz)

   SHH 6881 Pergamum
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